Wafer inspection system
Optimal for shipping inspection/receiving inspection.
This is a device that performs four inspection processes: "IR inspection," "front/back surface inspection," "thickness inspection (simple Bow/Warp)," and "resistance value measurement" for solar cell wafers. It can inspect wafers at a high speed of one wafer per second.
- Company：レイリサーチ
- Price：50 million yen-100 million yen
